JPH0114940Y2 - - Google Patents
Info
- Publication number
- JPH0114940Y2 JPH0114940Y2 JP8831783U JP8831783U JPH0114940Y2 JP H0114940 Y2 JPH0114940 Y2 JP H0114940Y2 JP 8831783 U JP8831783 U JP 8831783U JP 8831783 U JP8831783 U JP 8831783U JP H0114940 Y2 JPH0114940 Y2 JP H0114940Y2
- Authority
- JP
- Japan
- Prior art keywords
- lead
- support block
- measuring
- leads
- contact
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000000523 sample Substances 0.000 claims description 21
- 239000004065 semiconductor Substances 0.000 claims description 12
- 239000000463 material Substances 0.000 claims description 6
- 238000005452 bending Methods 0.000 description 11
- 230000002950 deficient Effects 0.000 description 5
- 238000005259 measurement Methods 0.000 description 3
- 239000011347 resin Substances 0.000 description 3
- 229920005989 resin Polymers 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000007599 discharging Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
- 230000035939 shock Effects 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8831783U JPS59194080U (ja) | 1983-06-08 | 1983-06-08 | 半導体装置の特性測定装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8831783U JPS59194080U (ja) | 1983-06-08 | 1983-06-08 | 半導体装置の特性測定装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS59194080U JPS59194080U (ja) | 1984-12-24 |
| JPH0114940Y2 true JPH0114940Y2 (en]) | 1989-05-02 |
Family
ID=30218229
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP8831783U Granted JPS59194080U (ja) | 1983-06-08 | 1983-06-08 | 半導体装置の特性測定装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS59194080U (en]) |
-
1983
- 1983-06-08 JP JP8831783U patent/JPS59194080U/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS59194080U (ja) | 1984-12-24 |
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